An approach for modeling dynamic analysis using ontologies

Newres Al Haider, Paddy Nixon, Benoit Gaudin

Research output: A Conference proceeding or a Chapter in BookConference contribution

2 Citations (Scopus)

Abstract

In this paper we present the possibility of using an ontology based framework in order to model Dynamic Analysis techniques. This work relies on similar ideas applied to the case of Static Analysis, in which ontologies are used to represent some knowledge about the programs to be analyzed. In the approach proposed in this paper we describe how ontologies can be applied to Dynamic Analysis by modeling both the information collected from the system, as well as some requirements about the type of analysis to be performed. Both of these ontologies can be designed by integrating ontologies previously defined during the software development cycle, allowing for re-usability. Finally, these ontologies make it possible to reason about concepts related to Dynamic Analysis and offer tools that facilitate automation. This paper presents the main ideas of the proposed approach and illustrates them with an example related to Frequency Spectrum Analysis.
Original languageEnglish
Title of host publication Jonathan Cook, James A. Jones: Proceedings of the International Workshop on Dynamic Analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2010), WODA 2010, Trento, Italy, July 12, 2010
EditorsJonathan Cook
Place of PublicationUnited States
PublisherAssociation for Computing Machinery (ACM)
Pages1-6
Number of pages6
ISBN (Print)9781450301374
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventInternational Workshop on Dynamic Analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2010), WODA 2010 - Trento, Trento, Italy
Duration: 12 Jul 201012 Jul 2010

Workshop

WorkshopInternational Workshop on Dynamic Analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2010), WODA 2010
Abbreviated titleWODA 2010
CountryItaly
CityTrento
Period12/07/1012/07/10

Fingerprint Dive into the research topics of 'An approach for modeling dynamic analysis using ontologies'. Together they form a unique fingerprint.

  • Cite this

    Al Haider, N., Nixon, P., & Gaudin, B. (2010). An approach for modeling dynamic analysis using ontologies. In J. Cook (Ed.), Jonathan Cook, James A. Jones: Proceedings of the International Workshop on Dynamic Analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2010), WODA 2010, Trento, Italy, July 12, 2010 (pp. 1-6). Association for Computing Machinery (ACM). https://doi.org/10.1145/1868321.1868322