Analysis of the Error Probability of a Binary Receiver in Wireless Fading Channels

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Abstract

Mobile and wireless communications are rapidly developing, "what lies ahead for cellular technology?" published by George Lawton (G. Lawton, June 2005) shows this concern. Binary receiver in wireless fading channels is one of important issues in the digital wireless communications. The error probability of binary in Nakagami-m fading channels was investigated in this paper. In particularly, the application for optimum binary receiver was carefully presented for the so called optimum threshold for an error probability. At the same time, the related Nakagami-m parameter fading channels were also estimated by closed forms, which can be applied to the based estimation for the digital communication systems with various noises. As one application, the error probability was used to estimate the bottom line of binary communication systems. Other digital coding systems are discussed in separated papers
Original languageEnglish
Title of host publicationThe 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies
EditorsDr Hyeong-Ho Lee
Place of PublicationRepublic of Korea
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1087-1090
Number of pages4
ISBN (Print)9788955191295
DOIs
Publication statusPublished - 2006
Event8th International Conference on Advanced Communication Technology - Phoenix Park, Korea, Democratic People's Republic of
Duration: 20 Feb 200622 Feb 2006

Conference

Conference8th International Conference on Advanced Communication Technology
CountryKorea, Democratic People's Republic of
CityPhoenix Park
Period20/02/0622/02/06

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Huang, X., & Sharma, D. (2006). Analysis of the Error Probability of a Binary Receiver in Wireless Fading Channels. In D. H-H. Lee (Ed.), The 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies (pp. 1087-1090). Republic of Korea: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICACT.2006.206161