Brief History of recombination noise in semiconductor junction devices

Paul Edwards

doi:10.1117/12.497117

Brief History of recombination noise in semiconductor junction devices

Paul Edwards

Research output: A Conference proceeding or a Chapter in Book › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.

Original language	English
Title of host publication	Proceedings of SPIE 5113: Noise in Devices and Circuits
Editors	M Jamal Deen, Zeynep Celik-Butler, Michael E Levinshtein
Place of Publication	Washington, USA
Publisher	SPIE
Pages	204-216
Number of pages	13
ISBN (Print)	9780819449733
DOIs	https://doi.org/10.1117/12.497117
Publication status	Published - 2003
Event	Noise in Devices and Circuits Conference - SPIE - Sante Fe, New Mexico, United States Duration: 2 Jun 2003 → 3 Jun 2003

Conference

Conference	Noise in Devices and Circuits Conference - SPIE
Country/Territory	United States
City	New Mexico
Period	2/06/03 → 3/06/03

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10.1117/12.497117

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title = "Brief History of recombination noise in semiconductor junction devices",

abstract = "This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.",

author = "Paul Edwards",

year = "2003",

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booktitle = "Proceedings of SPIE 5113: Noise in Devices and Circuits",

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address = "United States",

note = "Noise in Devices and Circuits Conference - SPIE ; Conference date: 02-06-2003 Through 03-06-2003",

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Y1 - 2003

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AB - This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.

U2 - 10.1117/12.497117

DO - 10.1117/12.497117

M3 - Conference contribution

SN - 9780819449733

SP - 204

EP - 216

BT - Proceedings of SPIE 5113: Noise in Devices and Circuits

A2 - Deen, M Jamal

A2 - Celik-Butler, Zeynep

A2 - Levinshtein, Michael E

PB - SPIE

CY - Washington, USA

T2 - Noise in Devices and Circuits Conference - SPIE

Y2 - 2 June 2003 through 3 June 2003

ER -

Brief History of recombination noise in semiconductor junction devices

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