Brief History of recombination noise in semiconductor junction devices

Paul Edwards

    Research output: A Conference proceeding or a Chapter in BookConference contribution

    1 Citation (Scopus)

    Abstract

    This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.
    Original languageEnglish
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits
    EditorsM Jamal Deen, Zeynep Celik-Butler, Michael E Levinshtein
    Place of PublicationWashington, USA
    PublisherSPIE
    Pages204-216
    Number of pages13
    ISBN (Print)9780819449733
    DOIs
    Publication statusPublished - 2003
    EventNoise in Devices and Circuits Conference - SPIE - Sante Fe, New Mexico, United States
    Duration: 2 Jun 20033 Jun 2003

    Conference

    ConferenceNoise in Devices and Circuits Conference - SPIE
    CountryUnited States
    CityNew Mexico
    Period2/06/033/06/03

    Fingerprint

    semiconductor junctions
    histories
    junction transistors
    junction diodes
    shot noise
    light emission
    light emitting diodes
    retarding
    lasers

    Cite this

    Edwards, P. (2003). Brief History of recombination noise in semiconductor junction devices. In M. J. Deen, Z. Celik-Butler, & M. E. Levinshtein (Eds.), Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits (pp. 204-216). Washington, USA: SPIE. https://doi.org/10.1117/12.497117
    Edwards, Paul. / Brief History of recombination noise in semiconductor junction devices. Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits. editor / M Jamal Deen ; Zeynep Celik-Butler ; Michael E Levinshtein. Washington, USA : SPIE, 2003. pp. 204-216
    @inproceedings{43ec5eccb50949fd93be7ffe1373f112,
    title = "Brief History of recombination noise in semiconductor junction devices",
    abstract = "This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.",
    author = "Paul Edwards",
    year = "2003",
    doi = "10.1117/12.497117",
    language = "English",
    isbn = "9780819449733",
    pages = "204--216",
    editor = "Deen, {M Jamal} and Zeynep Celik-Butler and Levinshtein, {Michael E}",
    booktitle = "Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits",
    publisher = "SPIE",
    address = "United States",

    }

    Edwards, P 2003, Brief History of recombination noise in semiconductor junction devices. in MJ Deen, Z Celik-Butler & ME Levinshtein (eds), Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits. SPIE, Washington, USA, pp. 204-216, Noise in Devices and Circuits Conference - SPIE, New Mexico, United States, 2/06/03. https://doi.org/10.1117/12.497117

    Brief History of recombination noise in semiconductor junction devices. / Edwards, Paul.

    Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits. ed. / M Jamal Deen; Zeynep Celik-Butler; Michael E Levinshtein. Washington, USA : SPIE, 2003. p. 204-216.

    Research output: A Conference proceeding or a Chapter in BookConference contribution

    TY - GEN

    T1 - Brief History of recombination noise in semiconductor junction devices

    AU - Edwards, Paul

    PY - 2003

    Y1 - 2003

    N2 - This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.

    AB - This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.

    U2 - 10.1117/12.497117

    DO - 10.1117/12.497117

    M3 - Conference contribution

    SN - 9780819449733

    SP - 204

    EP - 216

    BT - Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits

    A2 - Deen, M Jamal

    A2 - Celik-Butler, Zeynep

    A2 - Levinshtein, Michael E

    PB - SPIE

    CY - Washington, USA

    ER -

    Edwards P. Brief History of recombination noise in semiconductor junction devices. In Deen MJ, Celik-Butler Z, Levinshtein ME, editors, Proceedings of SPIE - The International Society for Optical Engineering: Noise in Devices and Circuits. Washington, USA: SPIE. 2003. p. 204-216 https://doi.org/10.1117/12.497117