Brief History of recombination noise in semiconductor junction devices

Paul Edwards

    Research output: A Conference proceeding or a Chapter in BookConference contribution

    1 Citation (Scopus)

    Abstract

    This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.
    Original languageEnglish
    Title of host publicationProceedings of SPIE 5113: Noise in Devices and Circuits
    EditorsM Jamal Deen, Zeynep Celik-Butler, Michael E Levinshtein
    Place of PublicationWashington, USA
    PublisherSPIE
    Pages204-216
    Number of pages13
    ISBN (Print)9780819449733
    DOIs
    Publication statusPublished - 2003
    EventNoise in Devices and Circuits Conference - SPIE - Sante Fe, New Mexico, United States
    Duration: 2 Jun 20033 Jun 2003

    Conference

    ConferenceNoise in Devices and Circuits Conference - SPIE
    CountryUnited States
    CityNew Mexico
    Period2/06/033/06/03

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    Cite this

    Edwards, P. (2003). Brief History of recombination noise in semiconductor junction devices. In M. J. Deen, Z. Celik-Butler, & M. E. Levinshtein (Eds.), Proceedings of SPIE 5113: Noise in Devices and Circuits (pp. 204-216). Washington, USA: SPIE. https://doi.org/10.1117/12.497117