Epipolar geometry from the deformation of an active contour

Elisa Martínez; Carme Torras

doi:10.1109/ICPR.2000.905393

Epipolar geometry from the deformation of an active contour

Elisa Martínez, Carme Torras

Research output: A Conference proceeding or a Chapter in Book › Conference contribution › peer-review

1 Citation (Scopus)

6 Downloads (Pure)

Abstract

An active contour is used to track a target in a sequence recorded by a walking robot in an unstructured scene. The deformations of the contour are analysed in order to extract the robot's egomotion, from which we compute the epipolar geometry that guides the matching between different views of the scene. The results prove that the proposed solution is a promising alternative to the prevalent techniques based on the costly computation of displacement or velocity fields [12, 14].

Original language	English
Title of host publication	Proceedings of the 15th International Conference on Pattern Recognition (ICPR 2000)
Editors	A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, J. Crowley, Y. Shirai
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	534-537
Number of pages	4
Volume	15
ISBN (Print)	0769507506
DOIs	https://doi.org/10.1109/ICPR.2000.905393
Publication status	Published - 3 Sept 2000
Externally published	Yes
Event	15th International Conference on Pattern Recognition - Barcelona, Spain Duration: 3 Sept 2000 → 7 Sept 2000

Conference

Conference	15th International Conference on Pattern Recognition
Abbreviated title	ICPR 2000
Country/Territory	Spain
City	Barcelona
Period	3/09/00 → 7/09/00

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10.1109/ICPR.2000.905393

PaperFinal published version, 471 KB

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Martínez, E., & Torras, C. (2000). Epipolar geometry from the deformation of an active contour. In A. Sanfeliu, J. J. Villanueva, M. Vanrell, R. Alquezar, J. Crowley, & Y. Shirai (Eds.), Proceedings of the 15th International Conference on Pattern Recognition (ICPR 2000) (Vol. 15, pp. 534-537). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICPR.2000.905393

Martínez, Elisa ; Torras, Carme. / Epipolar geometry from the deformation of an active contour. Proceedings of the 15th International Conference on Pattern Recognition (ICPR 2000). editor / A. Sanfeliu ; J.J. Villanueva ; M. Vanrell ; R. Alquezar ; J. Crowley ; Y. Shirai. Vol. 15 United States : IEEE, Institute of Electrical and Electronics Engineers, 2000. pp. 534-537

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keywords = "Epipolar geometry, Active contours, Robotics",

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Martínez, E & Torras, C 2000, Epipolar geometry from the deformation of an active contour. in A Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, J Crowley & Y Shirai (eds), Proceedings of the 15th International Conference on Pattern Recognition (ICPR 2000). vol. 15, IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 534-537, 15th International Conference on Pattern Recognition, Barcelona, Spain, 3/09/00. https://doi.org/10.1109/ICPR.2000.905393

Epipolar geometry from the deformation of an active contour. / Martínez, Elisa; Torras, Carme.
Proceedings of the 15th International Conference on Pattern Recognition (ICPR 2000). ed. / A. Sanfeliu; J.J. Villanueva; M. Vanrell; R. Alquezar; J. Crowley; Y. Shirai. Vol. 15 United States: IEEE, Institute of Electrical and Electronics Engineers, 2000. p. 534-537.

Research output: A Conference proceeding or a Chapter in Book › Conference contribution › peer-review

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AB - An active contour is used to track a target in a sequence recorded by a walking robot in an unstructured scene. The deformations of the contour are analysed in order to extract the robot's egomotion, from which we compute the epipolar geometry that guides the matching between different views of the scene. The results prove that the proposed solution is a promising alternative to the prevalent techniques based on the costly computation of displacement or velocity fields [12, 14].

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Martínez E, Torras C. Epipolar geometry from the deformation of an active contour. In Sanfeliu A, Villanueva JJ, Vanrell M, Alquezar R, Crowley J, Shirai Y, editors, Proceedings of the 15th International Conference on Pattern Recognition (ICPR 2000). Vol. 15. United States: IEEE, Institute of Electrical and Electronics Engineers. 2000. p. 534-537 doi: 10.1109/ICPR.2000.905393

Epipolar geometry from the deformation of an active contour

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