Image and Its Noise Removal in Nakagami Fading Channels

Xu Huang, A Madoc

Research output: A Conference proceeding or a Chapter in BookConference contribution

6 Citations (Scopus)

Abstract

A maximum likelihood for Bayesian estimator based on alpha-stability was discussed in our previous papers. It is in terms of closer to a realistic situation, and unlike previous methods used for Bayesian estimators, for the case discussed here, it is not necessary to know the variance of the noise. The Bayesian estimator here is based on a Nakagami fading channel. Our previous research results has been extended to that Bayesian estimator that we investigated and is still working well for the image noise removal in Nakagami fading channels. As an example, an improved Bayesian estimator (soft and hard threshold methods), is illustrated in our discussion
Original languageEnglish
Title of host publicationThe 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies
EditorsDr Hyeong-Ho Lee
Place of PublicationRepublic of Korea
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages570-573
Number of pages4
ISBN (Electronic)8955191294
ISBN (Print)9788955191295
DOIs
Publication statusPublished - 2006
Event8th International Conference on Advanced Communication Technology - Phoenix Park, Korea, Democratic People's Republic of
Duration: 20 Feb 200622 Feb 2006

Conference

Conference8th International Conference on Advanced Communication Technology
CountryKorea, Democratic People's Republic of
CityPhoenix Park
Period20/02/0622/02/06

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Cite this

Huang, X., & Madoc, A. (2006). Image and Its Noise Removal in Nakagami Fading Channels. In D. H-H. Lee (Ed.), The 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies (pp. 570-573). Republic of Korea: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICACT.2006.206034
Huang, Xu ; Madoc, A. / Image and Its Noise Removal in Nakagami Fading Channels. The 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies. editor / Dr Hyeong-Ho Lee. Republic of Korea : IEEE, Institute of Electrical and Electronics Engineers, 2006. pp. 570-573
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Huang, X & Madoc, A 2006, Image and Its Noise Removal in Nakagami Fading Channels. in DH-H Lee (ed.), The 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies. IEEE, Institute of Electrical and Electronics Engineers, Republic of Korea, pp. 570-573, 8th International Conference on Advanced Communication Technology, Phoenix Park, Korea, Democratic People's Republic of, 20/02/06. https://doi.org/10.1109/ICACT.2006.206034

Image and Its Noise Removal in Nakagami Fading Channels. / Huang, Xu; Madoc, A.

The 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies. ed. / Dr Hyeong-Ho Lee. Republic of Korea : IEEE, Institute of Electrical and Electronics Engineers, 2006. p. 570-573.

Research output: A Conference proceeding or a Chapter in BookConference contribution

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AB - A maximum likelihood for Bayesian estimator based on alpha-stability was discussed in our previous papers. It is in terms of closer to a realistic situation, and unlike previous methods used for Bayesian estimators, for the case discussed here, it is not necessary to know the variance of the noise. The Bayesian estimator here is based on a Nakagami fading channel. Our previous research results has been extended to that Bayesian estimator that we investigated and is still working well for the image noise removal in Nakagami fading channels. As an example, an improved Bayesian estimator (soft and hard threshold methods), is illustrated in our discussion

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Huang X, Madoc A. Image and Its Noise Removal in Nakagami Fading Channels. In Lee DH-H, editor, The 8th International Conference on Advanced Communication Technology. Toward the Era of Ubiquitous Networks and Societies. Republic of Korea: IEEE, Institute of Electrical and Electronics Engineers. 2006. p. 570-573 https://doi.org/10.1109/ICACT.2006.206034