Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator

Xu Huang, A Madoc, Dharmendra Sharma

Research output: A Conference proceeding or a Chapter in BookConference contribution

2 Citations (Scopus)

Abstract

A maximum likelihood for Bayesian estimator based on alpha-stable was discussed in our previous papers. It is in terms of closer to a realistic situation, and unlike previous methods used for Bayesian estimator, for the case discussed here it is not necessary to know the variance of the noise. The Bayesian estimator here is based on in a Nakagami fading channel. Our previous research results has been extended to that Bayesian estimator that we investigated is still working well for the image noise removal in Nakagami fading channels. As an example, an improved Bayesian estimator (soft and hard threshold methods), is illustrated in our discussion
Original languageEnglish
Title of host publicationProceedings Third International Workshop on Electronic Design, Test and Applications
EditorsPatrick Girard, Adam Osseiran, Moi-Tin Chew
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages31-43
Number of pages13
ISBN (Print)0769525008
DOIs
Publication statusPublished - 2006
Event3rd IEEE International Workshop on Electronic Design, Test and Applications - Kuala Lumpur, Malaysia
Duration: 17 Jan 200619 Jan 2006

Conference

Conference3rd IEEE International Workshop on Electronic Design, Test and Applications
CountryMalaysia
CityKuala Lumpur
Period17/01/0619/01/06

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Cite this

Huang, X., Madoc, A., & Sharma, D. (2006). Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator. In P. Girard, A. Osseiran, & M-T. Chew (Eds.), Proceedings Third International Workshop on Electronic Design, Test and Applications (pp. 31-43). USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DELTA.2006.54
Huang, Xu ; Madoc, A ; Sharma, Dharmendra. / Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator. Proceedings Third International Workshop on Electronic Design, Test and Applications. editor / Patrick Girard ; Adam Osseiran ; Moi-Tin Chew. USA : IEEE, Institute of Electrical and Electronics Engineers, 2006. pp. 31-43
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Huang, X, Madoc, A & Sharma, D 2006, Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator. in P Girard, A Osseiran & M-T Chew (eds), Proceedings Third International Workshop on Electronic Design, Test and Applications. IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 31-43, 3rd IEEE International Workshop on Electronic Design, Test and Applications, Kuala Lumpur, Malaysia, 17/01/06. https://doi.org/10.1109/DELTA.2006.54

Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator. / Huang, Xu; Madoc, A; Sharma, Dharmendra.

Proceedings Third International Workshop on Electronic Design, Test and Applications. ed. / Patrick Girard; Adam Osseiran; Moi-Tin Chew. USA : IEEE, Institute of Electrical and Electronics Engineers, 2006. p. 31-43.

Research output: A Conference proceeding or a Chapter in BookConference contribution

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Huang X, Madoc A, Sharma D. Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator. In Girard P, Osseiran A, Chew M-T, editors, Proceedings Third International Workshop on Electronic Design, Test and Applications. USA: IEEE, Institute of Electrical and Electronics Engineers. 2006. p. 31-43 https://doi.org/10.1109/DELTA.2006.54