Abstract
A maximum likelihood for Bayesian estimator based on alpha-stable was discussed in our previous papers. It is in terms of closer to a realistic situation, and unlike previous methods used for Bayesian estimator, for the case discussed here it is not necessary to know the variance of the noise. The Bayesian estimator here is based on in a Nakagami fading channel. Our previous research results has been extended to that Bayesian estimator that we investigated is still working well for the image noise removal in Nakagami fading channels. As an example, an improved Bayesian estimator (soft and hard threshold methods), is illustrated in our discussion
Original language | English |
---|---|
Title of host publication | Proceedings Third International Workshop on Electronic Design, Test and Applications |
Editors | Patrick Girard, Adam Osseiran, Moi-Tin Chew |
Place of Publication | USA |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 31-43 |
Number of pages | 13 |
ISBN (Print) | 0769525008 |
DOIs | |
Publication status | Published - 2006 |
Event | 3rd IEEE International Workshop on Electronic Design, Test and Applications - Kuala Lumpur, Malaysia Duration: 17 Jan 2006 → 19 Jan 2006 |
Conference
Conference | 3rd IEEE International Workshop on Electronic Design, Test and Applications |
---|---|
Country/Territory | Malaysia |
City | Kuala Lumpur |
Period | 17/01/06 → 19/01/06 |