Noises Removal for Images in Nakagami Fading Channels by Wavelet-Based Bayesian Estimator

Xu Huang

    Research output: A Conference proceeding or a Chapter in BookConference contribution

    5 Citations (Scopus)

    Abstract

    With the projected significant growth in mobile internet and multimedia services, there is strong demand for wireless image communication. However, a lot of questions related to the multimedia wireless communications raised, such as “how to obtain a good quality images in wireless communication fading channels?” In this paper, we first established Bayesian estimator based on wireless communication modelled by Nakagami fading channel. Our previous research results [4-6] have been extended to this modelling, in particular for multi-noises, such as Gaussian and Poisson noises in Nakagami fading channels. As an example, an improved Bayesian estimator (soft and hard threshold methods), is also illustrated in this paper, not only by traditional assessments but also by “structural similarity”.
    Original languageEnglish
    Title of host publicationIEEE International Conference on Multimedia Expo 2008, Proceeding of IEEE ICME 2008
    Place of PublicationGermany
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages21-24
    Number of pages4
    Volume1
    ISBN (Print)9781424425716
    DOIs
    Publication statusPublished - 2008
    EventIEEE International Conference on Multimedia & Expo - Hannover, Germany
    Duration: 23 Jun 200826 Jun 2008

    Conference

    ConferenceIEEE International Conference on Multimedia & Expo
    CountryGermany
    CityHannover
    Period23/06/0826/06/08

    Fingerprint Dive into the research topics of 'Noises Removal for Images in Nakagami Fading Channels by Wavelet-Based Bayesian Estimator'. Together they form a unique fingerprint.

  • Cite this

    Huang, X. (2008). Noises Removal for Images in Nakagami Fading Channels by Wavelet-Based Bayesian Estimator. In IEEE International Conference on Multimedia Expo 2008, Proceeding of IEEE ICME 2008 (Vol. 1, pp. 21-24). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICME.2008.4607361