Novel Metrics for Face Recognition Using Local Binary Patterns

Len BUI; Dat Tran; Xu Huang; Girija Chetty

doi:10.1007/978-3-642-23851-2_45

Novel Metrics for Face Recognition Using Local Binary Patterns

Len BUI, Dat Tran, Xu Huang, Girija Chetty

Information Systems

Research output: A Conference proceeding or a Chapter in Book › Conference contribution › peer-review

4 Citations (Scopus)

Abstract

The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

Original language	English
Title of host publication	International Conference on Knowledge-Based and Intelligent Information and Engineering Systems
Subtitle of host publication	Lecture Notes in Artificial Intelligence
Editors	Andreas Kenig, Andreas Dengel, Knut Hinkelmann, Koichi Kise, Robert J Howlett, Lakhmi C Jain
Place of Publication	Germany
Publisher	Springer
Pages	436-445
Number of pages	10
Volume	6881
ISBN (Print)	9783642238505
DOIs	https://doi.org/10.1007/978-3-642-23851-2_45
Publication status	Published - 2011
Event	Knowledge-Based and Intelligent Information and Engineering Systems - Kaiserslautern, Kaiserslautern, Germany Duration: 12 Sept 2011 → 14 Sept 2011

Conference

Conference	Knowledge-Based and Intelligent Information and Engineering Systems
Abbreviated title	KES 2011
Country/Territory	Germany
City	Kaiserslautern
Period	12/09/11 → 14/09/11

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10.1007/978-3-642-23851-2_45

Cite this

BUI, L., Tran, D., Huang, X., & Chetty, G. (2011). Novel Metrics for Face Recognition Using Local Binary Patterns. In A. Kenig, A. Dengel, K. Hinkelmann, K. Kise, R. J. Howlett, & L. C. Jain (Eds.), International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence (Vol. 6881, pp. 436-445). Springer. https://doi.org/10.1007/978-3-642-23851-2_45

BUI, Len ; Tran, Dat ; Huang, Xu et al. / Novel Metrics for Face Recognition Using Local Binary Patterns. International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. editor / Andreas Kenig ; Andreas Dengel ; Knut Hinkelmann ; Koichi Kise ; Robert J Howlett ; Lakhmi C Jain. Vol. 6881 Germany : Springer, 2011. pp. 436-445

@inproceedings{cfe5c46debb044c385590ec0b288cf11,

title = "Novel Metrics for Face Recognition Using Local Binary Patterns",

abstract = "The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.",

keywords = "Face Recognition, Local Binary Pattern, chi square metric, Euclidean metric",

author = "Len BUI and Dat Tran and Xu Huang and Girija Chetty",

year = "2011",

doi = "10.1007/978-3-642-23851-2_45",

language = "English",

isbn = "9783642238505",

volume = "6881",

pages = "436--445",

editor = "Andreas Kenig and Andreas Dengel and Knut Hinkelmann and Koichi Kise and Howlett, {Robert J} and Jain, {Lakhmi C}",

booktitle = "International Conference on Knowledge-Based and Intelligent Information and Engineering Systems",

publisher = "Springer",

address = "Netherlands",

note = "Knowledge-Based and Intelligent Information and Engineering Systems, KES 2011 ; Conference date: 12-09-2011 Through 14-09-2011",

}

BUI, L, Tran, D , Huang, X & Chetty, G 2011, Novel Metrics for Face Recognition Using Local Binary Patterns. in A Kenig, A Dengel, K Hinkelmann, K Kise, RJ Howlett & LC Jain (eds), International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. vol. 6881, Springer, Germany, pp. 436-445, Knowledge-Based and Intelligent Information and Engineering Systems, Kaiserslautern, Rhineland-Palatinate, Germany, 12/09/11. https://doi.org/10.1007/978-3-642-23851-2_45

Novel Metrics for Face Recognition Using Local Binary Patterns. / BUI, Len; Tran, Dat ; Huang, Xu et al.
International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. ed. / Andreas Kenig; Andreas Dengel; Knut Hinkelmann; Koichi Kise; Robert J Howlett; Lakhmi C Jain. Vol. 6881 Germany: Springer, 2011. p. 436-445.

Research output: A Conference proceeding or a Chapter in Book › Conference contribution › peer-review

TY - GEN

T1 - Novel Metrics for Face Recognition Using Local Binary Patterns

AU - BUI, Len

AU - Tran, Dat

AU - Huang, Xu

AU - Chetty, Girija

PY - 2011

Y1 - 2011

N2 - The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

AB - The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

KW - Face Recognition

KW - Local Binary Pattern

KW - chi square metric

KW - Euclidean metric

U2 - 10.1007/978-3-642-23851-2_45

DO - 10.1007/978-3-642-23851-2_45

M3 - Conference contribution

SN - 9783642238505

VL - 6881

SP - 436

EP - 445

BT - International Conference on Knowledge-Based and Intelligent Information and Engineering Systems

A2 - Kenig, Andreas

A2 - Dengel, Andreas

A2 - Hinkelmann, Knut

A2 - Kise, Koichi

A2 - Howlett, Robert J

A2 - Jain, Lakhmi C

PB - Springer

CY - Germany

T2 - Knowledge-Based and Intelligent Information and Engineering Systems

Y2 - 12 September 2011 through 14 September 2011

ER -

BUI L, Tran D , Huang X , Chetty G. Novel Metrics for Face Recognition Using Local Binary Patterns. In Kenig A, Dengel A, Hinkelmann K, Kise K, Howlett RJ, Jain LC, editors, International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. Vol. 6881. Germany: Springer. 2011. p. 436-445 doi: 10.1007/978-3-642-23851-2_45

Novel Metrics for Face Recognition Using Local Binary Patterns

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