Novel Metrics for Face Recognition Using Local Binary Patterns

Len BUI, Dat Tran, Xu Huang, Girija Chetty

    Research output: A Conference proceeding or a Chapter in BookConference contribution

    3 Citations (Scopus)

    Abstract

    The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.
    Original languageEnglish
    Title of host publicationInternational Conference on Knowledge-Based and Intelligent Information and Engineering Systems
    Subtitle of host publicationLecture Notes in Artificial Intelligence
    EditorsAndreas Kenig, Andreas Dengel, Knut Hinkelmann, Koichi Kise, Robert J Howlett, Lakhmi C Jain
    Place of PublicationGermany
    PublisherSpringer
    Pages436-445
    Number of pages10
    Volume6881
    ISBN (Print)9783642238505
    DOIs
    Publication statusPublished - 2011
    EventKnowledge-Based and Intelligent Information and Engineering Systems - Kaiserslautern, Kaiserslautern, Germany
    Duration: 12 Sep 201114 Sep 2011

    Conference

    ConferenceKnowledge-Based and Intelligent Information and Engineering Systems
    Abbreviated titleKES 2011
    CountryGermany
    CityKaiserslautern
    Period12/09/1114/09/11

    Fingerprint

    Face recognition
    Experiments

    Cite this

    BUI, L., Tran, D., Huang, X., & Chetty, G. (2011). Novel Metrics for Face Recognition Using Local Binary Patterns. In A. Kenig, A. Dengel, K. Hinkelmann, K. Kise, R. J. Howlett, & L. C. Jain (Eds.), International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence (Vol. 6881, pp. 436-445). Germany: Springer. https://doi.org/10.1007/978-3-642-23851-2_45
    BUI, Len ; Tran, Dat ; Huang, Xu ; Chetty, Girija. / Novel Metrics for Face Recognition Using Local Binary Patterns. International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. editor / Andreas Kenig ; Andreas Dengel ; Knut Hinkelmann ; Koichi Kise ; Robert J Howlett ; Lakhmi C Jain. Vol. 6881 Germany : Springer, 2011. pp. 436-445
    @inproceedings{cfe5c46debb044c385590ec0b288cf11,
    title = "Novel Metrics for Face Recognition Using Local Binary Patterns",
    abstract = "The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.",
    keywords = "Face Recognition, Local Binary Pattern, chi square metric, Euclidean metric",
    author = "Len BUI and Dat Tran and Xu Huang and Girija Chetty",
    year = "2011",
    doi = "10.1007/978-3-642-23851-2_45",
    language = "English",
    isbn = "9783642238505",
    volume = "6881",
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    editor = "Andreas Kenig and Andreas Dengel and Knut Hinkelmann and Koichi Kise and Howlett, {Robert J} and Jain, {Lakhmi C}",
    booktitle = "International Conference on Knowledge-Based and Intelligent Information and Engineering Systems",
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    BUI, L, Tran, D, Huang, X & Chetty, G 2011, Novel Metrics for Face Recognition Using Local Binary Patterns. in A Kenig, A Dengel, K Hinkelmann, K Kise, RJ Howlett & LC Jain (eds), International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. vol. 6881, Springer, Germany, pp. 436-445, Knowledge-Based and Intelligent Information and Engineering Systems, Kaiserslautern, Germany, 12/09/11. https://doi.org/10.1007/978-3-642-23851-2_45

    Novel Metrics for Face Recognition Using Local Binary Patterns. / BUI, Len; Tran, Dat; Huang, Xu; Chetty, Girija.

    International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. ed. / Andreas Kenig; Andreas Dengel; Knut Hinkelmann; Koichi Kise; Robert J Howlett; Lakhmi C Jain. Vol. 6881 Germany : Springer, 2011. p. 436-445.

    Research output: A Conference proceeding or a Chapter in BookConference contribution

    TY - GEN

    T1 - Novel Metrics for Face Recognition Using Local Binary Patterns

    AU - BUI, Len

    AU - Tran, Dat

    AU - Huang, Xu

    AU - Chetty, Girija

    PY - 2011

    Y1 - 2011

    N2 - The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

    AB - The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

    KW - Face Recognition

    KW - Local Binary Pattern

    KW - chi square metric

    KW - Euclidean metric

    U2 - 10.1007/978-3-642-23851-2_45

    DO - 10.1007/978-3-642-23851-2_45

    M3 - Conference contribution

    SN - 9783642238505

    VL - 6881

    SP - 436

    EP - 445

    BT - International Conference on Knowledge-Based and Intelligent Information and Engineering Systems

    A2 - Kenig, Andreas

    A2 - Dengel, Andreas

    A2 - Hinkelmann, Knut

    A2 - Kise, Koichi

    A2 - Howlett, Robert J

    A2 - Jain, Lakhmi C

    PB - Springer

    CY - Germany

    ER -

    BUI L, Tran D, Huang X, Chetty G. Novel Metrics for Face Recognition Using Local Binary Patterns. In Kenig A, Dengel A, Hinkelmann K, Kise K, Howlett RJ, Jain LC, editors, International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. Vol. 6881. Germany: Springer. 2011. p. 436-445 https://doi.org/10.1007/978-3-642-23851-2_45