Novel Metrics for Face Recognition Using Local Binary Patterns

Len BUI, Dat Tran, Xu Huang, Girija Chetty

Research output: A Conference proceeding or a Chapter in BookConference contribution

3 Citations (Scopus)

Abstract

The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.
Original languageEnglish
Title of host publicationInternational Conference on Knowledge-Based and Intelligent Information and Engineering Systems
Subtitle of host publicationLecture Notes in Artificial Intelligence
EditorsAndreas Kenig, Andreas Dengel, Knut Hinkelmann, Koichi Kise, Robert J Howlett, Lakhmi C Jain
Place of PublicationGermany
PublisherSpringer
Pages436-445
Number of pages10
Volume6881
ISBN (Print)9783642238505
DOIs
Publication statusPublished - 2011
EventKnowledge-Based and Intelligent Information and Engineering Systems - Kaiserslautern, Kaiserslautern, Germany
Duration: 12 Sep 201114 Sep 2011

Conference

ConferenceKnowledge-Based and Intelligent Information and Engineering Systems
Abbreviated titleKES 2011
CountryGermany
CityKaiserslautern
Period12/09/1114/09/11

Fingerprint

Face recognition
Experiments

Cite this

BUI, L., Tran, D., Huang, X., & Chetty, G. (2011). Novel Metrics for Face Recognition Using Local Binary Patterns. In A. Kenig, A. Dengel, K. Hinkelmann, K. Kise, R. J. Howlett, & L. C. Jain (Eds.), International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence (Vol. 6881, pp. 436-445). Germany: Springer. https://doi.org/10.1007/978-3-642-23851-2_45
BUI, Len ; Tran, Dat ; Huang, Xu ; Chetty, Girija. / Novel Metrics for Face Recognition Using Local Binary Patterns. International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. editor / Andreas Kenig ; Andreas Dengel ; Knut Hinkelmann ; Koichi Kise ; Robert J Howlett ; Lakhmi C Jain. Vol. 6881 Germany : Springer, 2011. pp. 436-445
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keywords = "Face Recognition, Local Binary Pattern, chi square metric, Euclidean metric",
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BUI, L, Tran, D, Huang, X & Chetty, G 2011, Novel Metrics for Face Recognition Using Local Binary Patterns. in A Kenig, A Dengel, K Hinkelmann, K Kise, RJ Howlett & LC Jain (eds), International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. vol. 6881, Springer, Germany, pp. 436-445, Knowledge-Based and Intelligent Information and Engineering Systems, Kaiserslautern, Germany, 12/09/11. https://doi.org/10.1007/978-3-642-23851-2_45

Novel Metrics for Face Recognition Using Local Binary Patterns. / BUI, Len; Tran, Dat; Huang, Xu; Chetty, Girija.

International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. ed. / Andreas Kenig; Andreas Dengel; Knut Hinkelmann; Koichi Kise; Robert J Howlett; Lakhmi C Jain. Vol. 6881 Germany : Springer, 2011. p. 436-445.

Research output: A Conference proceeding or a Chapter in BookConference contribution

TY - GEN

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AU - BUI, Len

AU - Tran, Dat

AU - Huang, Xu

AU - Chetty, Girija

PY - 2011

Y1 - 2011

N2 - The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

AB - The paper presents a novel approach to face recognition using Local Binary Patterns (LBP) with the novel soft chi square and soft power metrics. Results of intensive experiments on two public databases, FERET and AT&T, show that these new metrics are efficient and flexible for real-time face recognition applications. They can reduce time performance and also achieve high recognition rate.

KW - Face Recognition

KW - Local Binary Pattern

KW - chi square metric

KW - Euclidean metric

U2 - 10.1007/978-3-642-23851-2_45

DO - 10.1007/978-3-642-23851-2_45

M3 - Conference contribution

SN - 9783642238505

VL - 6881

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EP - 445

BT - International Conference on Knowledge-Based and Intelligent Information and Engineering Systems

A2 - Kenig, Andreas

A2 - Dengel, Andreas

A2 - Hinkelmann, Knut

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A2 - Jain, Lakhmi C

PB - Springer

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BUI L, Tran D, Huang X, Chetty G. Novel Metrics for Face Recognition Using Local Binary Patterns. In Kenig A, Dengel A, Hinkelmann K, Kise K, Howlett RJ, Jain LC, editors, International Conference on Knowledge-Based and Intelligent Information and Engineering Systems: Lecture Notes in Artificial Intelligence. Vol. 6881. Germany: Springer. 2011. p. 436-445 https://doi.org/10.1007/978-3-642-23851-2_45