Riesz-based volume local binary pattern and a novel group expression model for group happiness intensity analysis

Xiaohua Huang, Abhinav DHALL, Gouying Zhao, Roland GOECKE, Matti Pietikainen

Research output: A Conference proceeding or a Chapter in BookConference contribution

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Abstract

Automatic emotion analysis and understanding has received much attention over the years in affective computing. Recently, there are increasing interests in inferring the emotional intensity of a group of people. For group emotional intensity analysis, feature extraction and group expression model are two critical issues. In this paper, we propose a new method to estimate the happiness intensity of a group of people in an image. Firstly, we combine the Riesz transform and the local binary pattern descriptor, named Riesz-based volume local binary pattern, which considers neighbouring changes not only in the spatial domain of a face but also along the different Riesz faces. Secondly, we exploit the continuous conditional random fields for constructing a new group expression model, which considers global and local attributes. Intensive experiments are performed on three challenging facial expression databases to evaluate the novel feature. Furthermore, experiments are conducted on the HAPPEI database to evaluate the new group expression model with the new feature. Our experimental results demonstrate the promising performance for group happiness intensity analysis.
Original languageEnglish
Title of host publicationProceedings of the British Machine Vision Conference (BMVC)
EditorsXianghua Xie, Mark W Jones, Gary K L Tam
Place of PublicationGreat Britain
PublisherBMVA Press
Pages34.1-34.13
Number of pages13
Volume1
ISBN (Print)9781901725537
DOIs
Publication statusPublished - 2015
Event26th British Machine Vision Conference 2015 - Swansea, Swansea, United Kingdom
Duration: 7 Sep 201510 Oct 2015

Conference

Conference26th British Machine Vision Conference 2015
CountryUnited Kingdom
CitySwansea
Period7/09/1510/10/15

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Huang, X., DHALL, A., Zhao, G., GOECKE, R., & Pietikainen, M. (2015). Riesz-based volume local binary pattern and a novel group expression model for group happiness intensity analysis. In X. Xie, M. W. Jones, & G. K. L. Tam (Eds.), Proceedings of the British Machine Vision Conference (BMVC) (Vol. 1, pp. 34.1-34.13). Great Britain: BMVA Press. https://doi.org/10.5244/c.29.34
Huang, Xiaohua ; DHALL, Abhinav ; Zhao, Gouying ; GOECKE, Roland ; Pietikainen, Matti. / Riesz-based volume local binary pattern and a novel group expression model for group happiness intensity analysis. Proceedings of the British Machine Vision Conference (BMVC). editor / Xianghua Xie ; Mark W Jones ; Gary K L Tam. Vol. 1 Great Britain : BMVA Press, 2015. pp. 34.1-34.13
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abstract = "Automatic emotion analysis and understanding has received much attention over the years in affective computing. Recently, there are increasing interests in inferring the emotional intensity of a group of people. For group emotional intensity analysis, feature extraction and group expression model are two critical issues. In this paper, we propose a new method to estimate the happiness intensity of a group of people in an image. Firstly, we combine the Riesz transform and the local binary pattern descriptor, named Riesz-based volume local binary pattern, which considers neighbouring changes not only in the spatial domain of a face but also along the different Riesz faces. Secondly, we exploit the continuous conditional random fields for constructing a new group expression model, which considers global and local attributes. Intensive experiments are performed on three challenging facial expression databases to evaluate the novel feature. Furthermore, experiments are conducted on the HAPPEI database to evaluate the new group expression model with the new feature. Our experimental results demonstrate the promising performance for group happiness intensity analysis.",
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Huang, X, DHALL, A, Zhao, G, GOECKE, R & Pietikainen, M 2015, Riesz-based volume local binary pattern and a novel group expression model for group happiness intensity analysis. in X Xie, MW Jones & GKL Tam (eds), Proceedings of the British Machine Vision Conference (BMVC). vol. 1, BMVA Press, Great Britain, pp. 34.1-34.13, 26th British Machine Vision Conference 2015, Swansea, United Kingdom, 7/09/15. https://doi.org/10.5244/c.29.34

Riesz-based volume local binary pattern and a novel group expression model for group happiness intensity analysis. / Huang, Xiaohua; DHALL, Abhinav; Zhao, Gouying; GOECKE, Roland; Pietikainen, Matti.

Proceedings of the British Machine Vision Conference (BMVC). ed. / Xianghua Xie; Mark W Jones; Gary K L Tam. Vol. 1 Great Britain : BMVA Press, 2015. p. 34.1-34.13.

Research output: A Conference proceeding or a Chapter in BookConference contribution

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Huang X, DHALL A, Zhao G, GOECKE R, Pietikainen M. Riesz-based volume local binary pattern and a novel group expression model for group happiness intensity analysis. In Xie X, Jones MW, Tam GKL, editors, Proceedings of the British Machine Vision Conference (BMVC). Vol. 1. Great Britain: BMVA Press. 2015. p. 34.1-34.13 https://doi.org/10.5244/c.29.34