Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions

Paul Edwards

Research output: A Conference proceeding or a Chapter in BookChapter

Original languageEnglish
Title of host publicationNoise and Fluctuations Control in Electronic Devices
EditorsA A Balandin
PublisherAmerican Scientific Publishers
Pages333-353
Number of pages21
Edition1
ISBN (Print)1-58883-005-5
Publication statusPublished - 2002

Cite this

Edwards, P. (2002). Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions. In A. A. Balandin (Ed.), Noise and Fluctuations Control in Electronic Devices (1 ed., pp. 333-353). American Scientific Publishers.