Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions

Paul Edwards

Research output: A Conference proceeding or a Chapter in BookChapter

Original languageEnglish
Title of host publicationNoise and Fluctuations Control in Electronic Devices
EditorsA A Balandin
PublisherAmerican Scientific Publishers
Pages333-353
Number of pages21
Edition1
ISBN (Print)1-58883-005-5
Publication statusPublished - 2002

Cite this

Edwards, P. (2002). Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions. In A. A. Balandin (Ed.), Noise and Fluctuations Control in Electronic Devices (1 ed., pp. 333-353). American Scientific Publishers.
Edwards, Paul. / Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions. Noise and Fluctuations Control in Electronic Devices. editor / A A Balandin. 1. ed. American Scientific Publishers, 2002. pp. 333-353
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Edwards, P 2002, Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions. in AA Balandin (ed.), Noise and Fluctuations Control in Electronic Devices. 1 edn, American Scientific Publishers, pp. 333-353.

Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions. / Edwards, Paul.

Noise and Fluctuations Control in Electronic Devices. ed. / A A Balandin. 1. ed. American Scientific Publishers, 2002. p. 333-353.

Research output: A Conference proceeding or a Chapter in BookChapter

TY - CHAP

T1 - Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions

AU - Edwards, Paul

PY - 2002

Y1 - 2002

M3 - Chapter

SN - 1-58883-005-5

SP - 333

EP - 353

BT - Noise and Fluctuations Control in Electronic Devices

A2 - Balandin, A A

PB - American Scientific Publishers

ER -

Edwards P. Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions. In Balandin AA, editor, Noise and Fluctuations Control in Electronic Devices. 1 ed. American Scientific Publishers. 2002. p. 333-353