Sub-Poissonian Recombination Noise in Macroscopic and Mesoscopic Semiconductor Junctions

Paul Edwards

Research output: A Conference proceeding or a Chapter in BookChapter

Original languageEnglish
Title of host publicationNoise and Fluctuations Control in Electronic Devices
EditorsA A Balandin
PublisherAmerican Scientific Publishers
Number of pages21
ISBN (Print)1-58883-005-5
Publication statusPublished - 2002

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