Systems' Integration Technical Risks' Assessment Model (SITRAM)

Irena Loutchkina, Lakhmi JAIN, Thong Nguyen, Sergey Nesterov

    Research output: Contribution to journalArticle

    7 Citations (Scopus)

    Abstract

    This paper presents a novel system integration technical risk assessment model (SITRAM), which is based on Bayesian belief networks (BBN) coupled with parametric models (PM).
    Original languageEnglish
    Pages (from-to)342-352
    Number of pages11
    JournalIEEE Transactions on Systems, Man and Cybernetics: Systems
    Volume44
    Issue number3
    DOIs
    Publication statusPublished - 2014

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