This paper presents a novel system integration technical risk assessment model (SITRAM), which is based on Bayesian belief networks (BBN) coupled with parametric models (PM).
|Number of pages||11|
|Journal||IEEE Transactions on Systems, Man and Cybernetics: Systems|
|Publication status||Published - 2014|
Loutchkina, I., JAIN, L., Nguyen, T., & Nesterov, S. (2014). Systems' Integration Technical Risks' Assessment Model (SITRAM). IEEE Transactions on Systems, Man and Cybernetics: Systems, 44(3), 342-352. https://doi.org/10.1109/TSMC.2013.2256126